National Research Foundation of Korea

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	Semiconductor Research Team Daegu Gyeongbuk Institute of Science & Technology Electricity/Electronics > Semiconductor Device/System (Government-funded Research Institute) / Total, Daegu https://scholar.google.co.kr/citations?hl=en&user=gHPkF-kAAAAJ&view_op=list_works&sortby=pubdate

Career Experience
Name	Hyeon-Jun Lee	Phone Number	email me	Email	dear.hjlee@dgist.ac.kr

A study on the effect of pulse rising and falling time on amorphous oxide semiconductor transistors in driver circuits
Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis
Impact of transient currents caused by alternating drain stress in oxide semiconductors
Improved distribution of resistance switching through localized Ti-doped NiO layer with InZnOx/CuOx oxide diode
A study on the effect of pulse rising and falling time on amorphous oxide semiconductor transistors in driver circuits
Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis
Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor
Impact of transient currents caused by alternating drain stress in oxide semiconductors
Improved Distribution of Resistance Switching Through Localized Ti-Doped NiO Layer With InZnOx/CuOx Oxide Diode

Career Experience
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